|
|
|
Introduction to Focused Ion Beams: Instrumentation, Theory, Techniques and Practice
|
(Buch) |
Dieser Artikel gilt, aufgrund seiner Grösse, beim Versand als 3 Artikel!
| Lieferstatus: |
 Auf Bestellung (Lieferzeit unbekannt) |
| Veröffentlichung: |
Oktober 2010
|
| Genre: |
Naturwissensch., Medizin, Technik |
|
|
B /
Condensed matter /
Condensed Matter Physics /
Electronic Devices /
Electronic devices & materials /
Electronic materials /
Materials science /
Materials—Surfaces /
Microscopy /
Optical and Electronic Materials /
Optical Materials /
Physics and Astronomy /
Scientific equipment, experiments & techniques /
SIMS;instruments;material;microscopy;spectroscopy /
Solid State Physics /
spectroscopy /
Spectroscopy and Microscopy /
Spectrum analysis, spectrochemistry, mass spectrometry /
Surface chemistry & adsorption /
Surfaces and Interfaces, Thin Films /
Surfaces, Interfaces and Thin Film /
Thin films |
| ISBN: |
9781441935748 |
|
EAN-Code:
|
9781441935748 |
| Verlag: |
Springer Nature EN |
| Einband: |
Kartoniert |
| Sprache: |
English
|
| Dimensionen: |
H 235 mm / B 155 mm / D |
| Gewicht: |
1170 gr |
| Seiten: |
357 |
| Illustration: |
XVII, 357 p. 34 illus., 28 illus. in color., schwarz-weiss Illustrationen, farbige Illustrationen |
| Zus. Info: |
Previously published in hardcover |
| Bewertung: |
Titel bewerten / Meinung schreiben
|
| Inhalt: |
| Introduction to Focused Ion Beams is geared towards techniques and applications. This is the only text that discusses and presents the theory directly related to applications and the only one that discusses the vast applications and techniques used in FIBs and dual platform instruments. |
|
Newsfeed | 
Facebook | 
Twitter
