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Autor(en): 
  • Balasubramanian Muralikrishnan
  • Jayaraman Raja
  • Computational Surface and Roundness Metrology 
     

    (Buch)
    Dieser Artikel gilt, aufgrund seiner Grösse, beim Versand als 3 Artikel!


    Übersicht

    Auf mobile öffnen
     
    Lieferstatus:   Auf Bestellung (Lieferzeit unbekannt)
    Genre:  Naturwissensch., Medizin, Technik 
     
    C / Computer-Aided Design (CAD) / Computer-aided engineering / Computer-Aided Engineering (CAD, CAE) and Design / engineering / Machines, Tools, Processes / Manufactures / Manufacturing, Machines, Tools, Processes / Mathematical Modeling and Industrial Mathematics / Mathematical modelling / Mathematical models / Maths for engineers / Measurement / Measurement Science and Instrumentation / Physical measurements / Scientific standards, measurement etc
    ISBN:  9781849967730 
    EAN-Code: 
    9781849967730 
    Verlag:  Springer Nature EN 
    Einband:  Kartoniert  
    Sprache:  English  
    Dimensionen:  H 235 mm / B 155 mm / D  
    Gewicht:  439 gr 
    Seiten:  263 
    Illustration:  XX, 263 p. 87 illus., schwarz-weiss Illustrationen, Tabellen, schwarz-weiss 
    Zus. Info:  Previously published in hardcover 
    Bewertung: Titel bewerten / Meinung schreiben
    Inhalt:
    Computational Surface and Roundness Metrology provides an extraordinarily practical and hands-on approach towards understanding the diverse array of mathematical methods used in surface texture and roundness analysis. The book, in combination with a mathematical package or programming language interface, provides an invaluable tool for experimenting, learning, and discovering the many flavors of mathematics that are so routinely taken for granted in metrology.

    Whether the objective is to understand the origin of that ubiquitous transmission characteristics curve of a filter we see so often yet do not quite comprehend, or to delve into the intricate depths of a deceptively simple problem of fitting a line or a plane to a set of points, Computational Surface and Roundness Metrology describes it all (in exhaustive detail) using examples, illustrations, exercises, and a link to some of the finest publications in the field for over half a century.

    From the graduate student of metrology to the practicing engineer on the shop floor, Computational Surface and Roundness Metrology is a must-have reference for all involved in metrology, instrumentation/optics, manufacturing, and electronics.

      



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