Übersicht			Auf mobile öffnen

Lieferstatus:	i.d.R. innert 14-24 Tagen versandfertig
Veröffentlichung:	Oktober 1992
Genre:	Naturwissensch., Medizin, Technik
ISBN:	9780306442490
EAN-Code:	9780306442490
Verlag:	Palgrave Macmillan UK
Einband:	Gebunden
Sprache:	English
Dimensionen:	H 250 mm / B 175 mm / D 41 mm
Gewicht:	1282 gr
Seiten:	648
Bewertung:	Titel bewerten / Meinung schreiben

Inhalt:

Whole Pattern Fitting, Rietveld Analysis, and Calculated Diffraction Patterns. Quantitative Phase Analysis by XRay Diffraction (XRD). Thin Film and Surface Characterization by XRD. Lattice Defects and XRay Topography. Texture Analysis by XRD. XRD Instrumentation, Techniques, and Reference Materials. Stress Determination by Diffraction Methods. XRD Profile Fitting, Crystallite Size and Strain Determination. XRD Applications: Detection Limits, Superconductors, Organics, Minerals. Mathematical Methods in XRay Spectrometry (XRS). Thin Film and Surface Characterization by XRS and XPS. Total Reflection XRS. XRS Techniques and Instrumentation. XRS Applications. XRay Imaging and Tomography. 161 articles. Index.